• Presentation

    Our goal is to support research projects by providing the facilities of our Transmission Electron Microscope (TEM) to local research groups.
    We offer our service primarily to researchers from the ICP, but also to other local and national institutions like CSIC, UAM and other Universities, OPIs and companies.


    Our TEM service is equipped with a TEM/STEM (JEOL 2100F) operating at 200KV with a Field Emission Gun, obtaining a point resolution of 0.19 nm.

    Additionally, an EDX detector (INCA x-sight by Oxford Instruments) is coupled to the TEM, which allows the possibility of semi-quantitative chemical analysis.

    By using the STEM unit, Z-contrast images as well as the chemical characterization of areas of few nanometers can be done.


    Dra. Isabel Díaz Carretero (Responsible researcher)
    Dra. Laura Pascual (Responsible technician)
  • Personal

    Pascual Maroto, Laura Gema
    Group leader

  • Services

    In order to apply for the TEM service, it is necessary to download the application form and send it to the following e-mail address (laura.pascual@icp.csic.es). Our staff will contact you as soon as possible to fix a date and will also resolve any question you might have.
    Before sending the application form, please carefully read the TEM service’s rules.
    The offered services include:
    CTEM: Conventional TEM particle distribution and morphology analysis
    HRTEM: High resolution analysis resolving the atomic structure of the material with the additional possibility of getting an electron diffraction pattern (SAED)
    STEM-HAADF: Z-contrast images. Possibility of EDAX analysis in nanometric areas.
    All services can supplemented by an EDAX analysis.
    A sample preparation laboratory equipped with an ultrasound bath and basic lab material for powder samples is available.
  • Tarifas

    Tarifas actualizadas (a partir del 1 de abril de 2016)

    CON TECNICO (CTEM) 28 36 75 150
    CON TECNICO (STEM) 35 50 80 150
    SIN TECNICO (Semiautónomo) 18 24 50 150
     *Consultar posibilidad
  • Noticias

    noticias descripcion

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