• Presentation


    Our goal is to support research projects by providing the facilities of our Transmission Electron Microscope (TEM) to local research groups.
    We offer our service primarily to researchers from the ICP, but also to other local and national institutions like CSIC, UAM and other Universities, OPIs and companies.

    EQUIPMENT

    Our TEM service is equipped with a TEM/STEM (JEOL 2100F) operating at 200KV with a Field Emission Gun, obtaining a point resolution of 0.19 nm.

    Additionally, an EDX detector (INCA x-sight by Oxford Instruments) is coupled to the TEM, which allows the possibility of semi-quantitative chemical analysis.

    By using the STEM unit, Z-contrast images as well as the chemical characterization of areas of few nanometers can be done.

    PEOPLE

    Dra. Isabel Díaz Carretero (Responsible researcher)
    Dra. Laura Pascual (Responsible technician)
  • Personal

    Pascual Maroto, Laura Gema
    Group leader

  • Services


    In order to apply for the TEM service, it is necessary to download the application form and send it to the following e-mail address (laura.pascual@icp.csic.es). Our staff will contact you as soon as possible to fix a date and will also resolve any question you might have.
     
    Before sending the application form, please carefully read the TEM service’s rules.
     
    TYPE OF SERVICES
     
    The offered services include:
    CTEM: Conventional TEM particle distribution and morphology analysis
    HRTEM: High resolution analysis resolving the atomic structure of the material with the additional possibility of getting an electron diffraction pattern (SAED)
    STEM-HAADF: Z-contrast images. Possibility of EDAX analysis in nanometric areas.
     
    All services can supplemented by an EDAX analysis.
     
     
    A sample preparation laboratory equipped with an ultrasound bath and basic lab material for powder samples is available.
  • Tarifas

    TARIFAS MICROSCOPIA ELECTRONICA (HRTEM)

    Institutos y Centros CSIC
     
     
    32.23€/hora (H2020)
    25.26 €/hora (otros proyectos)
     
    Administraciones Públicas, Organismos Públicos de Investigación,
    ICTS, Fundaciones y Universidades
     
    80.67 €/hora
     
    Resto de Entidades 92.77 €/hora












    TARIFAS MICROSCOPIA ELECTRONICA (HRTEM CON REJILLA LACEY CARBON Cu)

    Institutos y Centros CSIC
     
     
    42.74€/hora (H2020)
    37.58 €/hora (otros proyectos)
     
    Administraciones Públicas, Organismos Públicos de Investigación,
    ICTS, Fundaciones y Universidades
     
    93.64 €/hora
     
    Resto de Entidades 107.69 €/hora



    Tarifas vigentes para solicitudes de análisis posteriores a 17/11/2017.

    Se aplicarán tarifas especiales con aquellas entidades con las que existan acuerdos o convenios.

    Cuando corresponda, se aplicará el IVA que esté en vigor.

    Estas tarifas incluyen la colocación de la rejilla, alineamiento del microscopio y supervisión del usuario en el manejo del equipo, así como entrega de resultados. Para la realización de medidas con técnico o de técnicas más sofisticadas se aplicará recargo (consultar previamente).


  • Noticias

    noticias descripcion

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